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Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress.

Philippe GalySylvain DuditMichel ValletC. RichierChristophe EntringerF. JezequelE. PetitJ. Beltritti
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • cmos technology
  • low voltage
  • low power
  • spl times
  • power consumption
  • real time
  • neural network
  • parallel processing
  • image sensor
  • object oriented
  • power dissipation