Login / Signup
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Thomas Beauchêne
David Trémouilles
Dean Lewis
Philippe Perdu
Pascal Fouillat
Published in:
Microelectron. Reliab. (2003)
Keyphrases
</>
partial least squares
thin film
schottky barrier
partial least squares regression
neural network
image processing
artificial intelligence
support vector
regression model
dimension reduction
range data
small scale
power plant
fiber optic
defect classification