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CADless laser assisted methodologies for failure analysis and device reliability.
A. Deyine
Kevin Sanchez
Philippe Perdu
F. Battistella
Dean Lewis
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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wide range
computer vision
data sets
quantitative analysis
low cost
software engineering
image analysis
database systems
image segmentation
artificial intelligence
information retrieval
data analysis
mobile devices
machine learning
neural network
databases
statistical analysis
real time
reliability analysis