Chee Lip Gan

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 15

Top Topics

Unsupervised Learning

Top Venues

Microelectron. Reliab.

IEEE Trans. Inf. Forensics Secur.

Publications

Xiaomei Zeng, Liu Qing, Samuel Chef, Chee Lip Gan
A Security Assessment of Protected Execute-Only Firmware in Microcontrollers Through Selective Chemical Engraving. HOST (2024)
Xiao Mei Zeng, Qing Liu, Chee Lip Gan
A Comprehensive Data Retrieval and Correction Approach From 40-nm Flash Memory With Selective Chemical Engraving. IEEE Trans. Inf. Forensics Secur. 19 (2024)
Samuel Chef, Chung Tah Chua, Jing Yun Tay, Chee Lip Gan
Explainable automated data estimation in Logic State Imaging of embedded SRAM. ISCAS (2024)
Samuel Chef, Chung Tah Chua, Jing Yun Tay, Jason Cheah, Chee Lip Gan
Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. FDTC (2022)
Xiao Mei Zeng, Qing Liu, Jing Yun Tay, Chee Lip Gan
Selective Staining on Non-Volatile Memory Cells for Data Retrieval. IEEE Trans. Inf. Forensics Secur. 17 (2022)
W. A. Sasangka, Yu Gao, Chee Lip Gan, Carl V. Thompson
Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. (2018)
Jakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan
Extensive Laser Fault Injection Profiling of 65 nm FPGA. J. Hardw. Syst. Secur. 1 (3) (2017)
Riko I. Made, Yu Gao, Govindo J. Syaranamual, W. A. Sasangka, L. Zhang, Xuan Sang Nguyen, Y. Y. Tay, J. S. Herrin, Carl V. Thompson, Chee Lip Gan
Characterisation of defects generated during constant current InGaN-on-silicon LED operation. Microelectron. Reliab. (2017)
W. A. Sasangka, Govindo J. Syaranamual, Y. Gao, Riko I. Made, Chee Lip Gan, Carl V. Thompson
Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors (HEMTs) with high density silicon nitride passivation. Microelectron. Reliab. (2017)
Govindo J. Syaranamual, W. A. Sasangka, Riko I. Made, Subramaniam Arulkumaran, Geok Ing Ng, S. C. Foo, Chee Lip Gan, Carl V. Thompson
Role of two-dimensional electron gas (2DEG) in AlGaN/GaN high electron mobility transistor (HEMT) ON-state degradation. Microelectron. Reliab. 64 (2016)
Wei He, Jakub Breier, Shivam Bhasin, Dirmanto Jap, Hock Guan Ong, Chee Lip Gan
Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA. SPACE (2016)
Adeline B. Y. Lim, Chris B. Boothroyd, Oranna Yauw, Bob Chylak, Chee Lip Gan, Zhong Chen
Interfacial evolution and bond reliability in thermosonic Pd coated Cu wire bonding on aluminum metallization: Effect of palladium distribution. Microelectron. Reliab. 63 (2016)
Adeline B. Y. Lim, Wei Jian Neo, Oranna Yauw, Bob Chylak, Chee Lip Gan, Zhong Chen
Evaluation of the corrosion performance of Cu-Al intermetallic compounds and the effect of Pd addition. Microelectron. Reliab. 56 (2016)
C. T. Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Microelectron. Reliab. 64 (2016)
Vinod K. Murugan, Zhigang Jia, Govindo J. Syaranamual, Chee Lip Gan, Yizhong Huang, Zhong Chen
Atmospheric corrosion resistance of electroplated Ni/Ni-P/Au electronic contacts. Microelectron. Reliab. 60 (2016)
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan
Unsupervised learning for signal mapping in dynamic photon emission. Microelectron. Reliab. 55 (9-10) (2015)
W. A. Sasangka, Govindo J. Syaranamual, Chee Lip Gan, Carl V. Thompson
Origin of physical degradation in AlGaN/GaN on Si high electron mobility transistors under reverse bias stressing. IRPS (2015)
Yuan Yuan Dai, Mei Zhen Ng, P. Anantha, Chee Lip Gan, Chuan Seng Tan
Copper micro and nano particles mixture for 3D interconnections application. 3DIC (2015)
Adeline B. Y. Lim, Andrew C. K. Chang, Oranna Yauw, Bob Chylak, Chee Lip Gan, Zhong Chen
Ultra-fine pitch palladium-coated copper wire bonding: Effect of bonding parameters. Microelectron. Reliab. 54 (11) (2014)
Ahmed Sharif, Chee Lip Gan, Zhong Chen
Customized glass sealant for ceramic substrates for high temperature electronic application. Microelectron. Reliab. 54 (12) (2014)
F. L. Lau, Riko I. Made, W. N. Putra, J. Z. Lim, V. C. Nachiappan, J. L. Aw, Chee Lip Gan
Electrical behavior of Au-Ge eutectic solder under aging for solder bump application in high temperature Electronics. Microelectron. Reliab. 53 (9-11) (2013)
M. K. Lim, Vassilios A. Chouliaras, Chee Lip Gan, Vincent M. Dwyer
Bidirectional electromigration failure. Microelectron. Reliab. 53 (9-11) (2013)
Meng Keong Lim, Jingyuan Lin, Yong Chiang Ee, Chee Mang Ng, Jun Wei, Chee Lip Gan
Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress. Microelectron. Reliab. 52 (8) (2012)
Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectron. Reliab. 51 (9-11) (2011)
F. X. Che, W. N. Putra, A. Heryanto, A. Trigg, S. Gao, Chee Lip Gan
Numerical and experimental study on Cu protrusion of Cu-filled through-silicon vias (TSV). 3DIC (2011)
Syed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel
Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. Microelectron. J. 38 (4-5) (2007)
Syed M. Alam, Frank L. Wei, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel
Electromigration Reliability Comparison of Cu and Al Interconnects. ISQED (2005)
Syed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel
Circuit Level Reliability Analysis of Cu Interconnects. ISQED (2004)