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Characterisation of defects generated during constant current InGaN-on-silicon LED operation.

Riko I. MadeYu GaoGovindo J. SyaranamualW. A. SasangkaL. ZhangXuan Sang NguyenY. Y. TayJ. S. HerrinCarl V. ThompsonChee Lip Gan
Published in: Microelectron. Reliab. (2017)
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