Electromigration Reliability Comparison of Cu and Al Interconnects.

Syed M. Alam Frank L. Wei Chee Lip Gan Carl V. Thompson Donald E. Troxel

Published in: ISQED (2005)

Keyphrases

input output
database
multi agent
information retrieval
genetic algorithm
information systems
three dimensional
database systems
lower bound
expert systems
low cost
highly reliable