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Experts
- M. Mayer
- Y. Zhou
- Philipp-Immanuel Dietrich
- Wolfgang Freude
- Tobias Hoose
- Matthias Blaicher
- J. T. Moon
- Christian Koos
- Bob Chylak
- Juned N. Kemal
- Tsung-Nan Tsai
- Sebastian Randel
- Michael Mayer
- Yi-Shao Lai
- Ute Troppenz
- Muhammad Rodlin Billah
- Martin Möhrle
- Lei Han
- Z. W. Zhong
- Tsang-Chuan Chang
- Y. C. Chan
- Yong Ding
- Oranna Yauw
- Ulrich Römer
- Chao-Ton Su
- Asit Kumar Gain
- Sebastian Schöps
- A. Hofmann
- Thorben Casper
- Golta Khatibi
- Zhong Chen
- Vicente Javier Clemente-Suárez
- Chi-Hung Su
- Kuen-Suan Chen
- Jang-Kyo Kim
- Aashish Shah
- Robert DeLine
- John Persic
- Anna Lindholm
Venues
- Microelectron. Reliab.
- Sensors
- J. Comput. Chem.
- IEEE Access
- Microelectron. J.
- PLoS Comput. Biol.
- NEMS
- OFC
- EGC
- Int. J. Prod. Res.
- J. Intell. Manuf.
- Medical Biol. Eng. Comput.
- IEEE Trans. Software Eng.
- IEEE Trans. Ind. Electron.
- 3DIC
- IRPS
- Inform. Spektrum
- J. Medical Syst.
- CoRR
- JFSMA
- Comput. Chem. Eng.
- ECOC
- J. Robotics Mechatronics
- Inform. Forsch. Entwickl.
- J. Integr. Bioinform.
- ICPP (1)
- J. Comput. Aided Mol. Des.
- Nucleic Acids Res.
- Leipziger Informatik-Tage
- Rev. Int. Géomatique
- International Conference on Computational Science (1)
- Math. Comput. Simul.
- TALN (Posters)
- IEEE Trans. Circuits Syst. II Express Briefs
- LMO
- ROBOT (1)
- ROBIO
- HSCC
- IEICE Trans. Electron.
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