Bidirectional electromigration failure.

M. K. Lim Vassilios A. Chouliaras Chee Lip Gan Vincent M. Dwyer

Published in: Microelectron. Reliab. (2013)

Keyphrases

failure rate
failure prediction
success or failure
real world
computer vision
cooperative
root cause
data sets
e learning
reinforcement learning
multiresolution
special case
failure modes
failure recovery