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Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.
Fulvio Infante
Philippe Perdu
Dean Lewis
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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high resolution
low resolution
image processing
high quality
image analysis
distance estimation
remote sensing
high throughput
neural network
real world
data sets
high level
mobile devices
magnetic field
sonar images
higher resolution
embedded systems
high frequency
complex systems
super resolution
computer vision