Login / Signup
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology.
Antoine Reverdy
Philippe Perdu
H. Murray
M. de la Bardonnie
Patrick Poirier
Published in:
Microelectron. Reliab. (2008)
Keyphrases
</>
back end
advanced technology
digital libraries
user friendly
building blocks
data types
data sets
infrared
statistical tests
e learning
knowledge base
preprocessing
information technology
tree structure