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Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs lifetime by Reliability Tests.

Fabio PrincipatoGiuseppe AllegraCorrado CappelloOlivier CrépelNicola NicosiaSalvatore D'ArrigoVincenzo CantarellaAlessandro Di MauroLeonardo AbbeneMarcello MirabelloFrancesco Pintacuda
Published in: Sensors (2021)
Keyphrases
  • power consumption
  • high speed
  • information systems
  • energy consumption
  • life span
  • power distribution systems
  • database
  • data sets
  • databases
  • three dimensional
  • low power
  • power management
  • reliability analysis
  • high impact