B. Foucher

Publication Activity (10 Years)

Years Active: 2001-2009
Publications (10 Years): 0

Publications

F. Molière, B. Foucher, Philippe Perdu, Alain Bravaix
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. Microelectron. Reliab. 49 (9-11) (2009)
E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher
Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. Microelectron. Reliab. 47 (12) (2007)
Philippe Galy, V. Berland, B. Foucher, A. Guilhaume, J. P. Chante, S. Bardy, F. Blanc
Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse. Microelectron. Reliab. 42 (9-11) (2002)
B. Foucher, J. Boullié, B. Meslet, D. Das
A review of reliability prediction methods for electronic devices. Microelectron. Reliab. 42 (8) (2002)
A. Guilhaume, Philippe Galy, J. P. Chante, B. Foucher, F. Blanc
Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges. Microelectron. Reliab. 41 (9-10) (2001)