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Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics.
F. Molière
B. Foucher
Philippe Perdu
Alain Bravaix
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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image processing
quantitative analysis
risk analysis
neural network
machine learning
artificial neural networks
signal processing
risk assessment
databases
information retrieval
learning algorithm
control system
process model
risk management
vlsi circuits