Peter Sandborn

Publication Activity (10 Years)

Years Active: 1994-2023
Publications (10 Years): 5

Top Topics

Return On Investment

Weather Forecasting

Knowledge Representation

Top Venues

Microelectron. Reliab.

J. Comput. Inf. Sci. Eng.

Publications

Ray Islam, Peter Sandborn
Demonstration of a Response Time Based Remaining Useful Life (RUL) Prediction for Software Systems. CoRR (2023)
M. Rubyet Islam, Peter Sandborn
Analyzing the Influence of Processor Speed and Clock Speed on Remaining Useful Life Estimation of Software Systems. CoRR (2023)
Xin Lei, Peter Sandborn, Roozbeh Bakhshi, Amir Kashani-Pour, Navid Goudarzi
PHM based predictive maintenance optimization for offshore wind farms. ICPHM (2015)
Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang
A return on investment analysis of applying health monitoring to LED lighting systems. Microelectron. Reliab. 55 (3-4) (2015)
Edwin Lillie, Peter Sandborn, David Humphrey
Assessing the value of a lead-free solder control plan using cost-based FMEA. Microelectron. Reliab. 55 (6) (2015)
Liyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn
Ontology-Based Knowledge Representation for Obsolescence Forecasting. J. Comput. Inf. Sci. Eng. 13 (1) (2013)
Varun J. Prabhakar, Peter Sandborn
A part total cost of ownership model for long life cycle electronic systems. Int. J. Comput. Integr. Manuf. 25 (4-5) (2012)
Peter Sandborn, Varun J. Prabhakar, O. Ahmad
Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescence. Microelectron. Reliab. 51 (2) (2011)
Kiri Feldman, Taoufik Jazouli, Peter Sandborn
A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management. IEEE Trans. Reliab. 58 (2) (2009)
Peter Sandborn, Michael G. Pecht
Introduction to special section on electronic systems prognostics and health management. Microelectron. Reliab. 47 (12) (2007)
E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher
Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. Microelectron. Reliab. 47 (12) (2007)
Zhen Shi, Peter Sandborn
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. J. Electron. Test. 22 (1) (2006)
Andre Kleyner, Peter Sandborn
A warranty forecasting model based on piecewise statistical distributions and stochastic simulation. Reliab. Eng. Syst. Saf. 88 (3) (2005)
Zhen Shi, Peter Sandborn
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. ITC (2003)
Daniel Ragan, Peter Sandborn, Paul Stoaks
A detailed cost model for concurrent use with hardware/software co-design. DAC (2002)
Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht
Process capability indices and product reliability. Microelectron. Reliab. 41 (12) (2001)
Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe
A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly. ITC (2001)
Peter Sandborn, Mike Vertal
Analyzing Packaging Trade-Offs During System Design. IEEE Des. Test Comput. 15 (3) (1998)
Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. J. Electron. Test. 10 (1-2) (1997)
Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh
Multichip systems trade-off analysis tool. J. Electron. Test. 5 (2-3) (1994)
Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake
Analyzing Multichip Module Testing Strategies. IEEE Des. Test Comput. 11 (1) (1994)
Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy
High Level Test Economics Advisor (Hi-TEA). J. Electron. Test. 5 (2-3) (1994)