Login / Signup

Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.

Cynthia F. MurphyMagdy S. AbadirPeter Sandborn
Published in: J. Electron. Test. (1997)
Keyphrases
  • economic analysis
  • database
  • digital libraries
  • special case
  • domain knowledge
  • machine learning
  • social networks
  • information systems
  • multiscale
  • expert systems
  • medical images
  • development process