CMOS circuit testing via time-resolved luminescence measurements and simulations.
Franco StellariAlberto TosiFranco ZappaSergio CovaPublished in: IEEE Trans. Instrum. Meas. (2004)
Keyphrases
- circuit design
- analog vlsi
- high speed
- delay insensitive
- cmos technology
- low cost
- vlsi circuits
- low voltage
- electromagnetic fields
- low power
- power consumption
- power dissipation
- numerical simulations
- electromagnetic field
- power supply
- digital circuits
- test cases
- chip design
- measured data
- simulation environment
- single phase
- test set
- high resolution