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Verification of untrusted chips using trusted layout and emission measurements.
Franco Stellari
Peilin Song
Alan J. Weger
Jim Culp
A. Herbert
Dirk Pfeiffer
Published in:
HOST (2014)
Keyphrases
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high speed
integrated circuit
third party
distributed environment
face verification
measurement noise
computer systems
functional verification
privacy preserving
model checking
security policies
measurement data
noisy measurements