Mesut Meterelliyoz

Publication Activity (10 Years)

Years Active: 2005-2019
Publications (10 Years): 2

Top Topics

Random Access Memory

Top Venues

IEEE J. Solid State Circuits

Publications

Pulkit Jain, Umut Arslan, Meenakshi Sekhar, Blake C. Lin, Liqiong Wei, Tanaya Sahu, Juan Alzate-vinasco, Ajay Vangapaty, Mesut Meterelliyoz, Nathan Strutt, Albert B. Chen, Patrick Hentges, Pedro A. Quintero, Chris Connor, Oleg Golonzka, Kevin Fischer, Fatih Hamzaoglu
Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V with Sensing Time of 5ns at 0.7V. ISSCC (2019)
Liqiong Wei, Juan G. Alzate, Umut Arslan, Justin Brockman, Nilanjan Das, Kevin Fischer, Tahir Ghani, Oleg Golonzka, Patrick Hentges, Rawshan Jahan, Pulkit Jain, Blake C. Lin, Mesut Meterelliyoz, Jim O'Donnell, Conor Puls, Pedro A. Quintero, Tanaya Sahu, Meenakshi Sekhar, Ajay Vangapaty, Chris Wiegand, Fatih Hamzaoglu
A 7Mb STT-MRAM in 22FFL FinFET Technology with 4ns Read Sensing Time at 0.9V Using Write-Verify-Write Scheme and Offset-Cancellation Sensing Technique. ISSCC (2019)
Fatih Hamzaoglu, Umut Arslan, Nabhendra Bisnik, Swaroop Ghosh, Manoj B. Lal, Nick Lindert, Mesut Meterelliyoz, Randy B. Osborne, Joodong Park, Shigeki Tomishima, Yih Wang, Kevin Zhang
A 1 Gb 2 GHz 128 GB/s Bandwidth Embedded DRAM in 22 nm Tri-Gate CMOS Technology. IEEE J. Solid State Circuits 50 (1) (2015)
Fatih Hamzaoglu, Umut Arslan, Nabhendra Bisnik, Swaroop Ghosh, Manoj B. Lal, Nick Lindert, Mesut Meterelliyoz, Randy B. Osborne, Joodong Park, Shigeki Tomishima, Yih Wang, Kevin Zhang
13.1 A 1Gb 2GHz embedded DRAM in 22nm tri-gate CMOS technology. ISSCC (2014)
Mesut Meterelliyoz, Fuad H. Al-amoody, Umut Arslan, Fatih Hamzaoglu, Luke Hood, Manoj B. Lal, Jeffrey L. Miller, Anand Ramasundar, Dan Soltman, Ifar Wan, Yih Wang, Kevin Zhang
generation embedded DRAM with 4X lower self refresh power in 22nm Tri-Gate CMOS technology. VLSIC (2014)
Eric Karl, Yih Wang, Yong-Gee Ng, Zheng Guo, Fatih Hamzaoglu, Mesut Meterelliyoz, John Keane, Uddalak Bhattacharya, Kevin Zhang, Kaizad Mistry, Mark Bohr
A 4.6 GHz 162 Mb SRAM Design in 22 nm Tri-Gate CMOS Technology With Integrated Read and Write Assist Circuitry. IEEE J. Solid State Circuits 48 (1) (2013)
Ashish Goel, Swaroop Ghosh, Mesut Meterelliyoz, Jeff Parkhurst, Kaushik Roy
Integrated Design & Test: Conquering the Conflicting Requirements of Low-Power, Variation-Tolerance and Test Cost. Asian Test Symposium (2011)
Mesut Meterelliyoz, Ashish Goel, Jaydeep P. Kulkarni, Kaushik Roy
Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit. ISSCC (2010)
Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2010)
Mesut Meterelliyoz, Jaydeep P. Kulkarni, Kaushik Roy
Analysis of SRAM and eDRAM Cache Memories Under Spatial Temperature Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (1) (2010)
Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka
Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED (2009)
Mesut Meterelliyoz, Kaushik Roy
Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations. ASP-DAC (2009)
Philip G. Emma, William R. Reohr, Mesut Meterelliyoz
Rethinking Refresh: Increasing Availability and Reducing Power in DRAM for Cache Applications. IEEE Micro 28 (6) (2008)
Mesut Meterelliyoz, Jaydeep P. Kulkarni, Kaushik Roy
Thermal analysis of 8-T SRAM for nano-scaled technologies. ISLPED (2008)
Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy
A high sensitivity process variation sensor utilizing sub-threshold operation. CICC (2008)
Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy
Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (11) (2007)
Aditya Bansal, Mesut Meterelliyoz, Siddharth Singh, Jung Hwan Choi, Jayathi Murthy, Kaushik Roy
Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology. ASP-DAC (2006)
Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy
Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits. ICCAD (2006)
Qikai Chen, Mesut Meterelliyoz, Kaushik Roy
A CMOS Thermal Sensor and Its Applications in Temperature Adaptive Design. ISQED (2006)
Mesut Meterelliyoz, Hamid Mahmoodi, Kaushik Roy
A leakage control system for thermal stability during burn-in test. ITC (2005)