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Integrated Design & Test: Conquering the Conflicting Requirements of Low-Power, Variation-Tolerance and Test Cost.
Ashish Goel
Swaroop Ghosh
Mesut Meterelliyoz
Jeff Parkhurst
Kaushik Roy
Published in:
Asian Test Symposium (2011)
Keyphrases
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low power
conflicting requirements
low cost
high speed
single chip
power consumption
vlsi architecture
logic circuits
low power consumption
general purpose
design process
vlsi circuits
image processing
power dissipation
gate array