Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits.
Jung Hwan ChoiAditya BansalMesut MeterelliyozJayathi MurthyKaushik RoyPublished in: ICCAD (2006)
Keyphrases
- electrical power
- high temperature
- thermal imaging
- thermal conductivity
- infrared
- surface temperature
- room temperature
- high speed
- air temperature
- heat transfer
- power dissipation
- parameter estimation
- estimation accuracy
- delay insensitive
- accurate estimation
- chip design
- power consumption
- neural network
- power supply
- finite element analysis
- analog circuits
- transmission line
- estimation error
- air conditioning