Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.
Jung Hwan ChoiAditya BansalMesut MeterelliyozJayathi MurthyKaushik RoyPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
- electrical power
- high temperature
- thermal imaging
- thermal conductivity
- power system
- heat transfer
- power plant
- room temperature
- analog circuits
- air temperature
- surface temperature
- total energy
- transmission line
- power consumption
- power supply
- chip design
- accurate estimation
- high speed
- real time
- relative humidity
- infrared