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Chris Connor
Publication Activity (10 Years)
Years Active: 2015-2021
Publications (10 Years): 4
Top Topics
Advanced Technologies
Detect Outliers
Manufacturing Processes
Rapid Development
Top Venues
IRPS
IEEE BigData
ISSCC
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Publications
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Yao-Feng Chang
,
Ilya Karpov
,
Reed Hopkins
,
David Janosky
,
Jacob Medeiros
,
Benjamin Sherrill
,
Jiahan Zhang
,
Yifu Huang
,
Tanmoy Pramanik
,
Albert B. Chen
,
Tony Acosta
,
Abdullah Guler
,
James A. O'Donnell
,
Pedro A. Quintero
,
Nathan Strutt
,
Oleg Golonzka
,
Chris Connor
,
Jack C. Lee
,
Jeffrey Hicks
Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability.
IRPS
(2021)
Yao-Feng Chang
,
James A. O'Donnell
,
Tony Acosta
,
Roza Kotlyar
,
Albert B. Chen
,
Pedro A. Quintero
,
Nathan Strutt
,
Oleg Golonzka
,
Chris Connor
,
Jeff Hicks
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology.
IRPS
(2020)
Pulkit Jain
,
Umut Arslan
,
Meenakshi Sekhar
,
Blake C. Lin
,
Liqiong Wei
,
Tanaya Sahu
,
Juan Alzate-vinasco
,
Ajay Vangapaty
,
Mesut Meterelliyoz
,
Nathan Strutt
,
Albert B. Chen
,
Patrick Hentges
,
Pedro A. Quintero
,
Chris Connor
,
Oleg Golonzka
,
Kevin Fischer
,
Fatih Hamzaoglu
Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V with Sensing Time of 5ns at 0.7V.
ISSCC
(2019)
James A. O'Donnell
,
Chris Connor
,
Tanmoy Pramanik
,
Jeff Hicks
,
Juan G. Alzate
,
Fatih Hamzaoglu
,
Justin Brockman
,
Oleg Golonzka
,
Kevin Fischer
eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology.
IRPS
(2019)
Abhinav Jauhri
,
Bradley McDanel
,
Chris Connor
Outlier detection for large scale manufacturing processes.
IEEE BigData
(2015)