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eNVM RRAM reliability performance and modeling in 22FFL FinFET technology.

Yao-Feng ChangJames A. O'DonnellTony AcostaRoza KotlyarAlbert B. ChenPedro A. QuinteroNathan StruttOleg GolonzkaChris ConnorJeff Hicks
Published in: IRPS (2020)
Keyphrases
  • data processing
  • cost effective
  • rapid development
  • technological advances
  • information retrieval
  • decision making
  • case study
  • data structure
  • st century