Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure.
Saibal MukhopadhyayKeunwoo KimKeith A. JenkinsChing-Te ChuangKaushik RoyPublished in: ISSCC (2007)
Keyphrases
- statistical tests
- statistical significance
- preprocessing
- significant improvement
- low cost
- machine learning methods
- machine learning
- neural network
- benchmark datasets
- statistical models
- empirical studies
- statistical approaches
- complex structures
- statistical analysis
- image segmentation
- information retrieval
- data mining