On-chip circuit to monitor long-term NBTI and PBTI degradation.
Keith A. JenkinsPong-Fei LuPublished in: Microelectron. Reliab. (2013)
Keyphrases
- long term
- analog vlsi
- high speed
- circuit design
- short term
- evolvable hardware
- cmos technology
- power dissipation
- chip design
- real time
- micron cmos
- low power
- phase locked loop
- mixed signal
- digital circuits
- monitoring system
- power consumption
- analog circuits
- evolutionary algorithm
- printed circuit boards
- physical design
- high density
- medium term
- vlsi design
- electronic circuits
- power reduction
- neural network
- nm technology
- low voltage
- design methodology