Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops.
Keith A. JenkinsJames P. EckhardtPublished in: IEEE Des. Test Comput. (2000)
Keyphrases
- phase locked
- error rate
- high speed
- preprocessing phase
- error free
- packet loss
- error bounds
- learning phase
- training phase
- neural network
- preprocessing
- image sequences
- real time
- generalization error
- artificial intelligence
- design methodology
- learning algorithm
- genetic algorithm
- approximation error
- information retrieval
- instruction set
- data mining
- functional verification