An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process.
Saibal MukhopadhyayKeunwoo KimKeith A. JenkinsChing-Te ChuangKaushik RoyPublished in: IEEE J. Solid State Circuits (2008)
Keyphrases
- statistical significance
- significant improvement
- high precision
- high accuracy
- recognition process
- computational cost
- synthetic data
- similarity measure
- correlation analysis
- hypothesis testing
- statistical tests
- high speed
- support vector machine
- mutual information
- computationally efficient
- segmentation method
- tree structure
- test data
- statistical methods
- experimental evaluation
- optimization process
- preprocessing
- objective function
- training data
- image segmentation