A statistical critical path monitor in 14nm CMOS.

Bruce M. Fleischer Christos Vezyrtzis Karthik Balakrishnan Keith A. Jenkins

Published in: ICCD (2016)

Keyphrases

critical path
job shop scheduling problem
real time
high speed
low cost
metal oxide semiconductor
silicon on insulator
power consumption
low power
cmos technology
nm technology
power supply
bayesian networks
search algorithm
particle swarm optimization
monitoring system