A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement.
Rahul M. RaoKeith A. JenkinsJae-Joon KimPublished in: ISSCC (2008)
Keyphrases
- circuit design
- phase locked loop
- high speed
- mixed signal
- analog vlsi
- cmos technology
- low power
- sigma delta
- evolvable hardware
- metal oxide semiconductor
- digital circuits
- multi channel
- measurement error
- power dissipation
- low voltage
- programmable logic
- genetic algorithm
- cmos image sensor
- chip design
- low cost
- signal processing
- data sets
- single chip
- intra class