Login / Signup
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology.
Tony Tae-Hyoung Kim
Pong-Fei Lu
Keith A. Jenkins
Chris H. Kim
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
</>
field effect transistors
real time
rapid development
wide range
case study
data processing
high reliability
artificial intelligence
monitoring system
key technologies
cost effective
high precision
personal computer
information retrieval
neural network
failure rate
feedback loop
database