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A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry.

Rahul M. RaoKeith A. JenkinsJae-Joon Kim
Published in: IEEE J. Solid State Circuits (2009)
Keyphrases
  • circuit design
  • measurement error
  • high speed
  • mixed signal
  • phase locked loop
  • low cost
  • single chip
  • analog vlsi
  • cmos image sensor
  • real time
  • np complete
  • detection method
  • physical design
  • programmable logic