Login / Signup
A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry.
Rahul M. Rao
Keith A. Jenkins
Jae-Joon Kim
Published in:
IEEE J. Solid State Circuits (2009)
Keyphrases
</>
circuit design
measurement error
high speed
mixed signal
phase locked loop
low cost
single chip
analog vlsi
cmos image sensor
real time
np complete
detection method
physical design
programmable logic