Young Hoon Kwark

Publication Activity (10 Years)

Years Active: 1999-2015
Publications (10 Years): 1

Top Topics

Cmos Technology

Error Resilience

Instruction Set

Top Venues

IEEE Trans. Instrum. Meas.

IEEE J. Solid State Circuits

Publications

Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Michael P. Beakes, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman
A 1.4 pJ/bit, Power-Scalable 16×12 Gb/s Source-Synchronous I/O With DFE Receiver in 32 nm SOI CMOS Technology. IEEE J. Solid State Circuits 50 (8) (2015)
Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman
A 1.4-pJ/b, power-scalable 16×12-Gb/s source-synchronous I/O with DFE receiver in 32nm SOI CMOS technology. CICC (2014)
Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster
Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures. IEEE Trans. Instrum. Meas. 61 (12) (2012)
Renato Rimolo-Donadio, Christian Schuster, Xiaoxiong Gu, Young Hoon Kwark, Mark B. Ritter
Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects. DATE (2008)
John F. Bulzacchelli, Mounir Meghelli, Sergey V. Rylov, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, Lei Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman
A 10-Gb/s 5-Tap DFE/4-Tap FFE Transceiver in 90-nm CMOS Technology. IEEE J. Solid State Circuits 41 (12) (2006)
Mounir Meghelli, Sergey V. Rylov, John F. Bulzacchelli, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, L. Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman
A 10Gb/s 5-Tap-DFE/4-Tap-FFE Transceiver in 90nm CMOS. ISSCC (2006)
John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM J. Res. Dev. 49 (4-5) (2005)
Seongwon Kim, Mohit Kapur, Mounir Meghelli, Alexander V. Rylyakov, Young Hoon Kwark, Daniel J. Friedman
45-Gb/s SiGe BiCMOS PRBS generator and PRBS checker [pseudorandom bit sequence]. CICC (2003)
Daniel J. Friedman, Mounir Meghelli, Benjamin D. Parker, Jungwook Yang, Herschel A. Ainspan, Alexander V. Rylyakov, Young Hoon Kwark, Mark B. Ritter, Lei Shan, Steven J. Zier, Michael Sorna, Mehmet Soyuer
SiGe BiCMOS integrated circuits for high-speed serial communication links. IBM J. Res. Dev. 47 (2-3) (2003)
Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark
Wide band home phone line characterization. IEEE Trans. Consumer Electron. 46 (1) (2000)
Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark
Wide band AC power line characterization. IEEE Trans. Consumer Electron. 45 (4) (1999)