Veit Kleeberger

Publication Activity (10 Years)

Years Active: 2012-2016
Publications (10 Years): 2

Top Topics

Instructional Materials

Predicting Future

Evaluation Method

Top Venues

Microelectron. Reliab.

Publications

Petra R. Maier, Veit Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann
Fault injection at host-compiled level with static fault set reduction for SoC firmware robustness testing. CODES+ISSS (2016)
Shushanik Karapetyan, Veit Kleeberger, Ulf Schlichtmann
FinFET-based product performance: Modeling and evaluation of standard cells in FinFET technologies. Microelectron. Reliab. 61 (2016)
Veit Kleeberger, Petra R. Maier, Ulf Schlichtmann
Workload- and Instruction-Aware Timing Analysis: The missing Link between Technology and System-level Resilience. DAC (2014)
Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn
Connecting different worlds - Technology abstraction for reliability-aware design and Test. DATE (2014)
Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. Microelectron. Reliab. 54 (6-7) (2014)
Veit Kleeberger, Helmut E. Graeb, Ulf Schlichtmann
Predicting future product performance: modeling and evaluation of standard cells in FinFET technologies. DAC (2013)
Veit Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann
Technology-aware system failure analysis in the presence of soft errors by Mixture Importance Sampling. DFTS (2013)
Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience. IEEE Micro 33 (4) (2013)
Alejandro Masrur, Philipp H. Kindt, Martin Becker, Samarjit Chakraborty, Veit Kleeberger, Martin Barke, Ulf Schlichtmann
Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling. RTCSA (2012)