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FinFET-based product performance: Modeling and evaluation of standard cells in FinFET technologies.

Shushanik KarapetyanVeit KleebergerUlf Schlichtmann
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • evaluation method
  • life cycle
  • data sets
  • neural network
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  • evaluation model
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  • iso iec
  • early adopters