Martin Barke

Publication Activity (10 Years)

Years Active: 2010-2015
Publications (10 Years): 1

Top Topics

Printed Circuit Boards

Integrated Circuit

Positive Effects

Top Venues

Microelectron. Reliab.

ACM J. Emerg. Technol. Comput. Syst.

Publications

Martin Barke, Ulf Schlichtmann
A Cross-Layer Approach to Measure the Robustness of Integrated Circuits. ACM J. Emerg. Technol. Comput. Syst. 12 (3) (2015)
Veit B. Kleeberger, Martin Barke, Christoph Werner, Doris Schmitt-Landsiedel, Ulf Schlichtmann
A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits. Microelectron. Reliab. 54 (6-7) (2014)
Martin Barke, Michael Kärgel, Markus Olbrich, Ulf Schlichtmann
Robustness measurement of integrated circuits and its adaptation to aging effects. Microelectron. Reliab. 54 (6-7) (2014)
Dominik Lorenz, Martin Barke, Ulf Schlichtmann
Monitoring of aging in integrated circuits by identifying possible critical paths. Microelectron. Reliab. 54 (6-7) (2014)
Alejandro Masrur, Philipp H. Kindt, Martin Becker, Samarjit Chakraborty, Veit Kleeberger, Martin Barke, Ulf Schlichtmann
Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling. RTCSA (2012)
Dominik Lorenz, Martin Barke, Ulf Schlichtmann
Efficiently analyzing the impact of aging effects on large integrated circuits. Microelectron. Reliab. 52 (8) (2012)
Dominik Lorenz, Martin Barke, Ulf Schlichtmann
Aging analysis at gate and macro cell level. ICCAD (2010)