Dominik Lorenz

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 9

Top Topics

Viral Marketing

Fourier Descriptors

Integrated Circuit

Top Venues

Microelectron. Reliab.

IEEE Trans. Reliab.

Publications

Patrick Esser, Sumith Kulal, Andreas Blattmann, Rahim Entezari, Jonas Müller, Harry Saini, Yam Levi, Dominik Lorenz, Axel Sauer, Frederic Boesel, Dustin Podell, Tim Dockhorn, Zion English, Kyle Lacey, Alex Goodwin, Yannik Marek, Robin Rombach
Scaling Rectified Flow Transformers for High-Resolution Image Synthesis. CoRR (2024)
Andreas Blattmann, Tim Dockhorn, Sumith Kulal, Daniel Mendelevitch, Maciej Kilian, Dominik Lorenz, Yam Levi, Zion English, Vikram Voleti, Adam Letts, Varun Jampani, Robin Rombach
Stable Video Diffusion: Scaling Latent Video Diffusion Models to Large Datasets. CoRR (2023)
Axel Sauer, Dominik Lorenz, Andreas Blattmann, Robin Rombach
Adversarial Diffusion Distillation. CoRR (2023)
Robin Rombach, Andreas Blattmann, Dominik Lorenz, Patrick Esser, Björn Ommer
High-Resolution Image Synthesis with Latent Diffusion Models. CVPR (2022)
Robin Rombach, Andreas Blattmann, Dominik Lorenz, Patrick Esser, Björn Ommer
High-Resolution Image Synthesis with Latent Diffusion Models. CoRR (2021)
Dominik Lorenz, Leonard Bereska, Timo Milbich, Björn Ommer
Unsupervised Part-Based Disentangling of Object Shape and Appearance. CoRR (2019)
Dominik Lorenz, Leonard Bereska, Timo Milbich, Björn Ommer
Unsupervised Part-Based Disentangling of Object Shape and Appearance. CVPR (2019)
Paul Wild, Dominik Lorenz, Tobias Grözinger, André Zimmermann
Effect of voids on thermo-mechanical reliability of chip resistor solder joints: Experiment, modelling and simulation. Microelectron. Reliab. 85 (2018)
Paul Wild, Tobias Grözinger, Dominik Lorenz, André Zimmermann
Void Formation and Their Effect on Reliability of Lead-Free Solder Joints on MID and PCB Substrates. IEEE Trans. Reliab. 66 (4) (2017)
Dominik Lorenz, Martin Barke, Ulf Schlichtmann
Monitoring of aging in integrated circuits by identifying possible critical paths. Microelectron. Reliab. 54 (6-7) (2014)
Dominik Lorenz, Martin Barke, Ulf Schlichtmann
Efficiently analyzing the impact of aging effects on large integrated circuits. Microelectron. Reliab. 52 (8) (2012)
Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann
Aging-aware Timing Analysis of Combinatorial Circuits on Gate Level (Alterungsanalyse von kombinatorischen Schaltungen auf Gatterebene). it Inf. Technol. 52 (4) (2010)
Dominik Lorenz, Martin Barke, Ulf Schlichtmann
Aging analysis at gate and macro cell level. ICCAD (2010)
Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann
Aging analysis of circuit timing considering NBTI and HCI. IOLTS (2009)
Stephan Henzler, Siegmar Koeppe, Dominik Lorenz, Winfried Kamp, Ronald Kuenemund, Doris Schmitt-Landsiedel
A Local Passive Time Interpolation Concept for Variation-Tolerant High-Resolution Time-to-Digital Conversion. IEEE J. Solid State Circuits 43 (7) (2008)
Stephan Henzler, Siegmar Koeppe, Dominik Lorenz, Winfried Kamp, Ronald Kuenemund, Doris Schmitt-Landsiedel
Variation tolerant high resolution and low latency time-to-digital converter. ESSCIRC (2007)