Monitoring of aging in integrated circuits by identifying possible critical paths.

Dominik Lorenz Martin Barke Ulf Schlichtmann

Published in: Microelectron. Reliab. (2014)

Keyphrases

integrated circuit
real time
monitoring system
electron beam
printed circuit boards
neural network
information systems
image processing
shortest path
age estimation
software aging
three dimensional
low cost
decision support
optimal path
condition monitoring