A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits.
Veit B. KleebergerMartin BarkeChristoph WernerDoris Schmitt-LandsiedelUlf SchlichtmannPublished in: Microelectron. Reliab. (2014)
Keyphrases
- probabilistic model
- integrated circuit
- objective function
- formal model
- statistical analysis
- prediction model
- mathematical model
- theoretical framework
- computational model
- management system
- probability distribution
- cost function
- prior knowledge
- neural network
- database
- em algorithm
- network structure
- conceptual model
- simulation model