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Robustness measurement of integrated circuits and its adaptation to aging effects.

Martin BarkeMichael KärgelMarkus OlbrichUlf Schlichtmann
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • integrated circuit
  • electron beam
  • computational efficiency
  • image processing
  • high robustness
  • data sets
  • search engine
  • input image
  • printed circuit boards