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The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM.

Jente B. KuangJeremy D. SchaubFadi H. GebaraDieter F. WendelThomas FröhnelSudesh SaroopSani R. NassifKevin J. Nowka
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2011)
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