Post-Silicon Timing Validation Method Using Path Delay Measurements.
Eun Jung JangJaeyong ChungAnne E. GattikerSani R. NassifJacob A. AbrahamPublished in: Asian Test Symposium (2011)
Keyphrases
- high accuracy
- classification method
- prior knowledge
- experimental evaluation
- high precision
- detection method
- preprocessing
- clustering method
- pairwise
- low cost
- probabilistic model
- segmentation algorithm
- significant improvement
- video sequences
- learning algorithm
- support vector machine svm
- training set
- computational complexity
- synthetic data
- segmentation method
- multiscale