Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach.
Saman KiamehrThomas H. OsieckiMehdi Baradaran TahooriSani R. NassifPublished in: DAC (2014)
Keyphrases
- error analysis
- silicon on insulator
- cmos technology
- error correction
- cross ratio
- least squares
- metal oxide semiconductor
- semiconductor devices
- high speed
- electronic devices
- case study
- infrared
- low power
- gate array
- analog circuits
- electronic circuits
- error estimates
- desktop computers
- ibm power processor
- power consumption
- medical images
- mobile devices