The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies.
Kanak AgarwalSani R. NassifPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2008)
Keyphrases
- metal oxide semiconductor
- power consumption
- cmos technology
- silicon on insulator
- low power
- random access memory
- low cost
- nm technology
- high speed
- low voltage
- legal issues
- hand held devices
- emerging technologies
- integrated circuit
- data mining
- leakage current
- embedded dram
- dynamic random access memory
- stability analysis
- data transmission
- power management
- power dissipation
- power supply
- image sensor
- wireless sensor networks
- neural network