SRAM Local Bit Line Access Failure Analyses.

Praveen Elakkumanan Jente B. Kuang Kevin J. Nowka Ramalingam Sridhar Rouwaida Kanj Sani R. Nassif

Published in: ISQED (2006)

Keyphrases

random access memory
line segments
access control
neural network

design considerations
failure detection
high speed
wireless networks

power consumption
low power
data transmission

random access
multiple users
failure prediction