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Statistical Modeling and Simulation of Threshold Variation Under Random Dopant Fluctuations and Line-Edge Roughness.
Yun Ye
Frank Liu
Min Chen
Sani R. Nassif
Yu Cao
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
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statistical modeling
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edge detection
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line segments
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edge information
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