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Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead.

Michael A. KochteChristian G. ZoellinHans-Joachim Wunderlich
Published in: ETS (2009)
Keyphrases
  • databases
  • social networks
  • computer vision
  • image processing
  • optimal solution
  • search algorithm
  • relational databases
  • test cases
  • pattern mining
  • statistical significance