Autonomous Testing for 3D-ICs with IEEE Std. 1687.

Jin-Cun Ye Michael A. Kochte Kuen-Jong Lee Hans-Joachim Wunderlich

Published in: ATS (2016)

Keyphrases

wireless lan
search algorithm
test set
test cases
real time embedded systems
database
neural network
artificial intelligence
bayesian networks
cooperative
information processing
service robots