Melanie Elm

Publication Activity (10 Years)

Years Active: 2008-2012
Publications (10 Years): 0

Top Topics

Search Algorithm

Statistical Tests

Graceful Degradation

Computer Simulation

Top Venues

J. Electron. Test.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Asian Test Symposium

Publications

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
Structural Test and Diagnosis for Graceful Degradation of NoC Switches. J. Electron. Test. 28 (6) (2012)
Alejandro Cook, Dominik Ull, Melanie Elm, Hans-Joachim Wunderlich, Helmut Randoll, Stefan Dohren
Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs. Asian Test Symposium (2012)
Michael A. Kochte, Melanie Elm, Hans-Joachim Wunderlich
Accurate X-Propagation for Test Applications by SAT-Based Reasoning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (12) (2012)
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
Structural Test for Graceful Degradation of NoC Switches. ETS (2011)
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein
Structural In-Field Diagnosis for Random Logic Circuits. ETS (2011)
Melanie Elm, Hans-Joachim Wunderlich
BISD: Scan-based Built-In self-diagnosis. DATE (2010)
Melanie Elm, Michael A. Kochte, Hans-Joachim Wunderlich
On Determining the Real Output Xs by SAT-Based Reasoning. Asian Test Symposium (2010)
Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
Test Encoding for Extreme Response Compaction. ETS (2009)
Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding
Scan chain clustering for test power reduction. DAC (2008)
Melanie Elm, Hans-Joachim Wunderlich
Scan Chain Organization for Embedded Diagnosis. DATE (2008)