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Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values.
Dominik Erb
Michael A. Kochte
Sven Reimer
Matthias Sauer
Hans-Joachim Wunderlich
Bernd Becker
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
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