Dominik Erb

Publication Activity (10 Years)

Years Active: 2013-2018
Publications (10 Years): 10

Top Venues

DATE

VTS

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

ETS

University of Freiburg, Germany (PHD)

Education History

University of Freiburg, Germany

PHD

Publications

Jan Burchard, Dominik Erb, Bernd Becker
Characterization of possibly detected faults by accurately computing their detection probability. DATE (2018)
Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (10) (2018)
Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
Efficient SAT-based generation of hazard-activated TSOF tests. VTS (2017)
Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker
Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG. DATE (2017)
Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. VLSI Design (2017)
Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker
Evaluating the effectiveness of D-chains in SAT-based ATPG. LATS (2017)
Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG. J. Electron. Test. 33 (6) (2017)
Karsten Scheibler, Dominik Erb, Bernd Becker
Applying Tailored Formal Methods to X-ATPG. MBMV (2016)
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. ASP-DAC (2016)
Karsten Scheibler, Dominik Erb, Bernd Becker
Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs. DATE (2016)
Karsten Scheibler, Dominik Erb, Bernd Becker
Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. ETS (2015)
Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. VTS (2015)
Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (12) (2015)
Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. ATS (2014)
Dominik Erb, Michael A. Kochte, Matthias Sauer, Stefan Hillebrecht, Tobias Schubert, Hans-Joachim Wunderlich, Bernd Becker
Exact Logic and Fault Simulation in Presence of Unknowns. ACM Trans. Design Autom. Electr. Syst. 19 (3) (2014)
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Test pattern generation in presence of unknown values based on restricted symbolic logic. ITC (2014)
Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker
Efficient SMT-based ATPG for interconnect open defects. DATE (2014)
Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker
Accurate QBF-based test pattern generation in presence of unknown values. DATE (2013)
Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Accurate Multi-cycle ATPG in Presence of X-Values. Asian Test Symposium (2013)

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Publication Activity (10 Years)

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Dominik Erb